Nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data in synthetic forsterite bicrystal samples (NERC Grant NE/S00162X/1)
The data are nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data collected on samples of synthetic forsterite bicrystals at room temperature. The data were collected in two samples, with high- and low- angle grain boundaries (HAGB, 60°, [100]/(011) and SB, 13°, [100]/(016)). The EBSD data are the basis for the HR-EBSD calculation. The HR-EBSD results are presented as Matlab data files. The nanoindentation data are categorised as a function of sample (‘ol13’ – low-angle grain boundary; and ‘ol60’ – high-angle grain boundary), and indenter tip geometry (spherical (with a 10 or 5 micron radius) and pyramidal (Berkovich). The data are presented in .xls files. The TEM data are presented as .tif files. The TEM data were collected in specific indents with various distances from the interfaces. These data have been published in the manuscript: : The Role of Grain Boundaries in Low-Temperature Plasticity of Olivine Revealed by Nanoindentation, with the DOI: 10.1029/2023JB026763
non geographic dataset
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http://data.bgs.ac.uk/id/dataHolding/13608147
English
Geoscientific information
GEMET - INSPIRE themes, version 1.0:
BGS Thesaurus of Geosciences:
Backscatter
X ray diffraction
Olivine
NGDC Deposited Data
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Free:
NERC_DDC
creation: 2023-11-03
2018-07-02
-
2021-10-01
University of Oxford
Diana Avadanii
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University of Oxford
Diana Avadanii
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British Geological Survey
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Data Quality
: Nanoindentation tests were conducted on a Nano Indenter® G200, using continuous stiffness measurement on the loading segment of the experiment. We investigated the residual impressions of the nanoindents using high-angular resolution electron backscatter diffraction (HR-EBSD). For this purpose, we collected EBSD patterns using an Oxford Instruments NordlysNano EBSD detector and stored them for subsequent cross-correlation analysis. We prepared the TEM foils using a FEI Helios® Nanolab G3 Dualbeam system at the Utrecht University microscopy center. We imaged two liftouts using an FEI Talos® F200X with an acquisition acceleration voltage of 200 kV and a beam current of 5–10 nA, also at the Utrecht University microscopy center. We additionally imaged two liftouts using a JEOL® 2100F microscope at Imperial College London. The microscope was operated with an acquisition acceleration voltage of 200 kV, and an emission current of 120 μA.
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Available under the Open Government Licence subject to the following acknowledgement accompanying the reproduced NERC materials "Contains NERC materials ©NERC [year]"
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2024-04-24